Q. When checking the applied waveform with a semiconductor impulse tester, an approximately 120 MHz (8.3 ns) damped oscillation waveform is observed after the rise. The waveform was measured at CDN OUT using the probe supplied with the oscilloscope. What

Q. When checking the applied waveform with a semiconductor impulse tester, an approximately 120 MHz (8.3 ns) damped oscillation waveform is observed after the rise. The waveform was measured at CDN OUT using the probe supplied with the oscilloscope. What

This is a characteristic of the semiconductor switch being used.